Property and cation valence engineering in entropy-stabilized oxide thin films

Author(s): 
George N. Kotsonis, Peter B. Meisenheimer, Leixin Miao, Joseph Roth, Baomin Wang, Padraic Shafer, Roman Engel-Herbert, Nasim Alem, John T. Heron, Christina M. Rost, and Jon-Paul Maria
Year: 
2020
Name of Journal: 
PHYSICAL REVIEW MATERIALS